ESP-V2 20 nm A pack of 10 High

A pack of 10 High quality etched silicon probes for hard TappingMode™ and other non-contact modes

Cantilever Thickness (Nom): 7 Cantilever Thickness (RNG): 6 - 8 Cantilever Geometry: Rectangular Cantilevers Number: 11 - 31 Front Side Coating: Conductive Diamond Back Side Coating: Reflective Aluminum

New super sharp probe for highest resolution imaging on the most delicate and challenging samples

3 N/m nominal

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2

ESP-V2 20 nm A pack of 10 High0. 2N m, 13kHz, 4 Sided Tip, No Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, ESP ESPA AFM probes. Brukers new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air. The new design